Ieee Transactions On Reliability SCIE

國際簡稱：IEEE T RELIAB 參考譯名：可靠性交易

主要研究方向：工程技術(shù)-工程：電子與電氣非預(yù)警期刊審稿周期：約4.5個(gè)月

《可靠性交易》(Ieee Transactions On Reliability)是一本由Institute of Electrical and Electronics Engineers Inc.出版的以工程技術(shù)-工程：電子與電氣為研究特色的國際期刊，發(fā)表該領(lǐng)域相關(guān)的原創(chuàng)研究文章、評論文章和綜述文章，及時(shí)報(bào)道該領(lǐng)域相關(guān)理論、實(shí)踐和應(yīng)用學(xué)科的最新發(fā)現(xiàn)，旨在促進(jìn)該學(xué)科領(lǐng)域科學(xué)信息的快速交流。該期刊是一本未開放期刊，近三年沒有被列入預(yù)警名單。該期刊享有很高的科學(xué)聲譽(yù)，影響因子不斷增加，發(fā)行量也同樣高。

2區(qū) 中科院分區(qū)
Q1 JCR分區(qū)
132 年發(fā)文量
5 IF影響因子
未開放 是否OA
86 H-index
1963 創(chuàng)刊年份
Quarterly 出版周期
English 出版語言

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.

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Ieee Transactions On Reliability期刊信息

ISSN：0018-9529
出版語言：English
是否OA：未開放
E-ISSN：1558-1721
出版地區(qū)：UNITED STATES
是否預(yù)警：否
出版商：Institute of Electrical and Electronics Engineers Inc.
出版周期：Quarterly
創(chuàng)刊時(shí)間：1963
開源占比：0.0455
Gold OA文章占比：16.74%
OA被引用占比：0
出版國人文章占比：0.38
出版撤稿占比：0
研究類文章占比：98.48%

Ieee Transactions On Reliability CiteScore評價(jià)數(shù)據(jù)（2024年最新版）

CiteScore

SJR

SNIP

CiteScore 指數(shù)

12.2

1.511

1.989

學(xué)科類別	分區(qū)	排名	百分位
大類：Engineering 小類：Safety, Risk, Reliability and Quality	Q1	7 / 207	96%
大類：Engineering 小類：Electrical and Electronic Engineering	Q1	57 / 797	92%

名詞解釋：CiteScore 是衡量期刊所發(fā)表文獻(xiàn)的平均受引用次數(shù)，是在 Scopus 中衡量期刊影響力的另一個(gè)指標(biāo)。當(dāng)年CiteScore 的計(jì)算依據(jù)是期刊最近4年（含計(jì)算年度）的被引次數(shù)除以該期刊近四年發(fā)表的文獻(xiàn)數(shù)。例如，2022年的 CiteScore 計(jì)算方法為：2022年的 CiteScore =2019-2022年收到的對2019-2022年發(fā)表的文件的引用數(shù)量÷2019-2022年發(fā)布的文獻(xiàn)數(shù)量注：文獻(xiàn)類型包括：文章、評論、會(huì)議論文、書籍章節(jié)和數(shù)據(jù)論文。

Ieee Transactions On Reliability中科院評價(jià)數(shù)據(jù)

中科院 2023年12月升級版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	計(jì)算機(jī)科學(xué)	2區(qū)	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	2區(qū) 2區(qū) 2區(qū)

中科院 2022年12月升級版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	計(jì)算機(jī)科學(xué)	2區(qū)	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	2區(qū) 2區(qū) 2區(qū)

中科院 2021年12月舊的升級版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
是	否	計(jì)算機(jī)科學(xué)	2區(qū)	COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	1區(qū) 2區(qū) 2區(qū)

中科院 2021年12月基礎(chǔ)版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	工程技術(shù)	3區(qū)	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	3區(qū) 2區(qū) 3區(qū)

中科院 2021年12月升級版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
是	否	計(jì)算機(jī)科學(xué)	2區(qū)	COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	1區(qū) 2區(qū) 2區(qū)

中科院 2020年12月舊的升級版

Top期刊	綜述期刊	大類學(xué)科		小類學(xué)科
否	否	計(jì)算機(jī)科學(xué)	2區(qū)	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 計(jì)算機(jī)：硬件 COMPUTER SCIENCE, SOFTWARE ENGINEERING 計(jì)算機(jī)：軟件工程 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：電子與電氣	2區(qū) 2區(qū) 2區(qū)

Ieee Transactions On Reliability JCR評價(jià)數(shù)據(jù)（2023-2024年最新版）

按JIF指標(biāo)學(xué)科分區(qū)	收錄子集	分區(qū)	排名	百分位
學(xué)科：COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	SCIE	Q1	8 / 59	87.3%
學(xué)科：COMPUTER SCIENCE, SOFTWARE ENGINEERING	SCIE	Q1	13 / 131	90.5%
學(xué)科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q1	65 / 352	81.7%

按JCI指標(biāo)學(xué)科分區(qū)	收錄子集	分區(qū)	排名	百分位
學(xué)科：COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	SCIE	Q1	7 / 59	88.98%
學(xué)科：COMPUTER SCIENCE, SOFTWARE ENGINEERING	SCIE	Q1	14 / 131	89.69%
學(xué)科：ENGINEERING, ELECTRICAL & ELECTRONIC	SCIE	Q1	42 / 354	88.28%

Ieee Transactions On Reliability歷年數(shù)據(jù)統(tǒng)計(jì)

影響因子

中科院分區(qū)

Ieee Transactions On Reliability中國學(xué)者發(fā)文選摘

1、Novel Discriminant Locality Preserving Projection Integrated With Monte Carlo Sampling for Fault Diagnosis
Author: He, Yan-Lin; Li, Kun; Liang, Li-Long; Xu, Yuan; Zhu, Qun-Xiong

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 166-176. DOI: 10.1109/TR.2021.3115108
2、Fault Diagnosability of Networks With Fault-Free Block at Local Vertex Under MM* Model
Author: Huang, Yanze; Lin, Limei; Lin, Yuhang; Xu, Li; Hsieh, Sun-Yuan

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 372-383. DOI: 10.1109/TR.2021.3129257
3、Improved Locality Preserving Projections Based on Heat-Kernel and Cosine Weights for Fault Classification in Complex Industrial Processes
Author: Zhang, Ning; Xu, Yuan; Zhu, Qun-Xiong; He, Yan-Lin

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 204-213. DOI: 10.1109/TR.2021.3139539
4、Resilience Enhancement for Multistate Interdependent Infrastructure Networks: From a Preparedness Perspective
Author: Wang, Kai; Xu, Zhaoping; Liu, Yu; Fang, Yiping

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 190-203. DOI: 10.1109/TR.2021.3132774
5、SeTransformer: A Transformer-Based Code Semantic Parser for Code Comment Generation
Author: Li, Zheng; Wu, Yonghao; Peng, Bin; Chen, Xiang; Sun, Zeyu; Liu, Yong; Paul, Doyle

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 258-273. DOI: 10.1109/TR.2022.3154773
6、Reliability of a Distributed Data Storage System Considering the External Impacts
Author: Kou, Gang; Yi, Kunxiang; Xiao, Hui; Peng, Rui

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 3-14. DOI: 10.1109/TR.2022.3161638
7、Reliability Modeling and Assessment for a Cyber-Physical System With a Complex Boundary Behavior
Author: Gong, Hongfang; Li, Renfa; An, Jiyao; Xie, Guoqi

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 224-239. DOI: 10.1109/TR.2022.3160460
8、An Intelligent Resource Management Solution for Hospital Information System Based on Cloud Computing Platform
Author: Gong, Siqian; Zhu, Xiaomin; Zhang, Runtong; Zhao, Hongmei; Guo, Chao

Journal: IEEE TRANSACTIONS ON RELIABILITY. 2023; Vol. 72, Issue 1, pp. 329-342. DOI: 10.1109/TR.2022.3161359